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    • Atomic Force Microscope
      • 2D Impedance Imaging
        • Au/SiN Test Structure
        • ZnO Varistor Surface
        • Nafion (PEMFC membrane) surface
      • Surface Potential Imaging
        • Artifact-free Surface Potential Imaging
        • Local Redox of Solid Oxide
      • Nanolithography
        • Metal Nano-Patterning
      • References

Atomic Force Microscope

Overview

The Atomic Force Microscopy (AFM) invented by Binnig, Quate and Gerber in 1986 is a probe based tool for investigating surface phenomena in high resolution. The AFM probes a sample surface with a sharp tip, the apex radius of which is only a few to a few tens of nm.

Contents:

• Impedance Imaging
• Surface Potential Imaging
• Nanolithography

References

Figure 1: Atomic Force Microscopy