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        • Artifact-free Surface Potential Imaging
        • Local Redox of Solid Oxide
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• Atomic Force Microscope
• Surface Potential Imaging

Surface Potential Imaging

Electric Force Microscopy (EFM) and Surface Potential imaging are AFM techniques which characterize material surfaces for electrical properties. A conductive AFM tip interacts with the sample through long-range Coulomb forces. These interactions change the oscillation amplitude and phase of the AFM cantilever, which are detected to create EFM or surface potential images.

Contents:

• Artifact Free Surface Potential Imaging
• Local Redox on Oxide Surface