Atomic Force Microscopy
References
8 document(s) found.W. Lee, M. Lee, Y.-B. Kim and F. B. Prinz, "Reduction and Oxidation of Oxide Ion Conductors with Conductive Atomic Force Microscopy", Nanotechnology, vol. 20, p. 445706, 2009.
M. Motoyama, N. P. Dasgupta, and F. B. Prinz, "Electrochemical Deposition of Metallic Nanowires as a Scanning Probe Tip", Journal of the Electrochemical Society [selected for Virtual Journal of Nanoscale Science & Technology, vol. 20, issue. 9 (2009)], vol. 156, pp. 431-438, 2009.
W. Lee and F. B. Prinz, "Area-Selective Atomic Layer Deposition using Self-Assembled Monolayer and Scanning Probe Lithography", J. Electrochem. Soc., vol. 156, 2009.
W. Ryu, Z. Huang, J.-S. Park, J. Moseley, A. R. Grossman, R. Fasching, F. B. Prinz , "Open Micro-fluidic System for Atomic Force Microscopy-Guided in situ Electrochemical Probing of a Single Cell", Lab on a Chip, vol. 8, pp. 1460-1467, 2008.
Y. Shen, M. Lee, W. Lee, D. M. Barnett, P. M. Pinsky and F. B. Prinz, "A Resolution Study for Electrostatic Force Microscopy on Bimetallic Samples using the Boundary Element Method", Nanotechnology, vol. 19, p. 35710, 2008.
81. M. Lee, R. O'Hayre, F. B. Prinz, and T. M. Gür, "Electrochemical Nanopatterning of Ag on Solid-State Ionic Conductor RbAg4I5 Using Atomic Force Microscopy", Appl. Phys. Lett. 85(#16), 3552 (2004) .
M. Lee, W. Lee and F. B. Prinz, "Geometric Artefact Suppressed Surface Potential Measurements", Nanotechnology, vol. 17, pp. 3728-3733, 2006.
W. Lee, C.-C. Chao, X. Jiang, J. Hwang, S. F. Bent, and F. B. Prinz, "Oxidative Removal of Self-Assembled Monolayers for Selective Atomic Layer Deposition", ECS Trans., vol. 16, pp. 173-179, 2008.
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