Yongxing Shen, Minhwan Lee, Wonyoung Lee, David M. Barnett, Peter M. Pinsky and Fritz B. Prinz, "A resolution study for electrostatic force microscopy on bimetallic samples using the boundary element method", Nanotechnology, vol. 19, p. 35710, 2008.
view

81. M. Lee, R. O'Hayre, F. B. Prinz, and T. M. Gür, "Electrochemical Nanopatterning of Ag on Solid-State Ionic Conductor RbAg4I5 Using Atomic Force Microscopy", Appl. Phys. Lett. 85(#16), 3552 (2004) .

Minhwan Lee, Wonyoung Lee and Fritz B. Prinz, "Geometric artefact suppressed surface potential measurements", Nanotechnology, vol. 17, pp. 3728-3733, 2006.
view