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    • Atomic Force Microscope

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• Atomic Force Microscope

Atomic Force Microscope

The Atomic Force Microscopy (AFM) is a probe based tool for investigating surface phenomena in high resolution. The AFM probes a sample surface with a sharp tip, the apex radius of which is only a few to a few tens of nm. Using this probe-based technique, diverse local electrical/electrochemical properties can be examined.

Read more about AFM in Atomic Force Microscope project